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6. |
COURSE OBJECTIVES: |
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After completion of this course the student will be able to: |
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1. |
Describe the major steps in the semiconductor assembly process. (I) |
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2. |
Describe the alignment and exposure process including development and inspection. (II) |
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3. |
Describe the purpose and parameters of annealing. (III) |
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4. |
List eight sources of contamination as well as methods of detection and control. (IV) |
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5. |
Describe the differences between various crystal structures. (V) |
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6. |
Describe the chemical vapor deposition process. (VI) |
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7. |
Contrast Bipolar and MOS transistors. (VII) |
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8. |
List the five steps of diffusion. (VII) |
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9. |
Describe the process of etching, including wet and dry etching, stripping, and after-cleaning inspection. (IX) |
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10. |
Explain electron bonding between silicon and oxygen. (X) |
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11. |
Contrast transistors, diodes, capacitors, and resistors. (XI) |
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12. |
Describe the purposes of the epitaxial layer, the steps of its growth, and characteristics used to evaluate it. (XII) |
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13. |
Explain the purpose, process, and effect of ion implantation. (XIII) |
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14. |
Define regions and functions and their electrical functions. (XIV) |
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15. |
Describe metalization, including its purpose, selection criteria, and deposition methods. (XV) |
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16. |
Identify common uses of oxidation, how it is done, and how it is evaluated. (XVI) |
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17. |
Describe the purpose and process of capacitance-voltage plotting. (XVII) |
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18. |
Explain the process and equipment used in photoresist application. (XVIII) |
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19. |
Describe the purpose and basic steps of photolithography. (XIX) |
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20. |
List two types of photoresists, their performance factors, and guidelines for their storage and handling. (XX) |
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21. |
Identify and write correct symbols and group numbers for elements using a periodic table. (XXI) |
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22. |
Interpret symbols and abbreviations commonly used in wafer fabrication. (XXII) |
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23. |
Compare conductors, insulators, and doped semi-conductors in terms of their valence band, availability of free electrons, width of forbidden zone, and relative energy required to excite. (XXIII) |
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24. |
Explain operation analysis and step analysis of a product produced in the fab. (XXIV) |
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25. |
Describe the purpose and process of resistivity and migration testing. (XXV) |